Effects of extreme disorder on electronic properties in δ-doped semiconductor microstructures—a realistic computer simulation
C. Metzner; M. Hofmann; G.H. Döhler
- 作者C. Metzner; M. Hofmann; G.H. Döhler
- 卷第25卷
- 印刷ISSN0749-6036
- 电子ISSN1096-3677
- 文件大小79.47KB
- 发表时间1999
- DOI10.1006/spmi.1998.0689
- 页码239-246