PR! A Social History of Spin
- 期刊名称American Journalism
- 作者Ferre, John P.
- 卷第16卷
- 期第1期
- 印刷ISSN0882-1127
- 电子ISSN2326-2486
- 文件大小118.66KB
- 发表时间1999-01
- DOI10.1080/08821127.1999.10739168
- 页码151-153
[IEEE 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Napa Valley, CA, USA (2004.04.29-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Proceedings 22 nd IEEE VLSI Test Symposium2004
[IEEE 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Napa Valley, CA, USA (2004.04.29-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Proceedings. 22nd IEEE VLSI Test Symposium2004
[IEEE 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Napa Valley, CA, USA (2004.04.29-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Proceedings 22 nd IEEE VLSI Test Symposium Copyright Page2004
[IEEE 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Napa Valley, CA, USA (2004.04.29-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Proceedings 22 nd IEEE VLSI Test Symposium Table of Contents2004
[IEEE 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Napa Valley, CA, USA (2004.04.29-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Foreword2004
[IEEE 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Napa Valley, CA, USA (2004.04.29-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Reviewers2004
[IEEE Proceedings. 22nd IEEE VLSI Test Symposium - Napa Valley, CA, USA (2004.04.25-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Acknowledgements2004
[IEEE 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Napa Valley, CA, USA (2004.04.29-2004.04.29)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Steering committee2004