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[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Issues in modeling small devices

[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Issues in modeling small devices

Laux, S.E.; Fischetti, M.V.

作者Laux, S.E.; Fischetti, M.V.
文件大小449.85KB
发表时间1999
DOI10.1109/iedm.1999.824207
页码523-526

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