Strain relaxation and strong impurity incorporation in epitaxial laterally overgrown GaN: Direct imaging of different growth domains by cathodoluminescence microscopy and micro-Raman spectroscopy

Bertram, F.; Riemann, T.; Christen, J.; Kaschner, A.; Hoffmann, A.; Thomsen, C.; Hiramatsu, K.; Shibata, T.; Sawaki, N.

期刊名称Applied Physics Letters
作者Bertram, F.; Riemann, T.; Christen, J.; Kaschner, A.; Hoffmann, A.; Thomsen, C.; Hiramatsu, K.; Shibata, T.; Sawaki, N.
卷第74卷
期第3期
印刷ISSN0003-6951
文件大小444.76KB
发表时间1999
DOI10.1063/1.123071

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