SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications V - Precise measurement of the amplitude of photorefractive index gratings
Sun, Ching-Cherng; Tu, Chung-Chen; Chen, M. C.; Chung, Peing T.; Donn, Shoang C.; Yu, Francis T. S.; Yin, Shizhuo
- 作者Sun, Ching-Cherng; Tu, Chung-Chen; Chen, M. C.; Chung, Peing T.; Donn, Shoang C.; Yu, Francis T. S.; Yin, Shizhuo
- 卷第3801卷
- 印刷ISSN0277-786X
- 文件大小227.54KB
- 发表时间1999
- DOI10.1117/12.363946
- 页码53-57