A Unifying Family of Group Sequential Test Designs
- 期刊名称Biometrics
- 作者John M. Kittelson and Scott S. Emerson
- 卷第55卷
- 期第3期
- 印刷ISSN0006-341X
- 电子ISSN1541-0420
- 文件大小1523.12KB
- 发表时间1999-09
- DOI10.2307/2533617
- 页码874-882
Specification Test for Poisson Regression ModelsLung-Fei Lee · International Economic Review · 1986
Housing and the Business CycleMorris A. Davis and Jonathan Heathcote · International Economic Review · 2005
The Optimum Growth Rate for PopulationPaul A. Samuelson · International Economic Review · 1975
Sufficient Conditions in Optimal Control TheorySeierstad, Atle; Sydsaeter, Knut · International Economic Review · 1977
Time PreferencePeter C. Fishburn and Ariel Rubinstein · International Economic Review · 1982
PROFITABILITY OF PRODUCT BUNDLING*Chen, Yongmin; Riordan, Michael H. · International Economic Review · 2013
THE INTERNATIONAL ECONOMIC REVIEW REFEREES 2012International Economic Review · 2013
A DEFENSE OF THE FOMC*Ellison, Martin; Sargent, Thomas J. · International Economic Review · 2012