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[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Characterization of power VDMOSFETs by split C-V measurements

[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Characterization of power VDMOSFETs by split C-V measurements

Habas, P.; Mileusnic, S.; Zivanov, T.

作者Habas, P.; Mileusnic, S.; Zivanov, T.
卷第1卷
文件大小493.65KB
发表时间1999
DOI10.1109/icmel.2000.840584
页码339-342

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