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Characterization of the Pb1 Interface Defect in Thermal (100)Si/SiO2 by Electron Spin Resonance: 29Si Hyperfine Structure and Electrical Relevance

Characterization of the Pb1 Interface Defect in Thermal (100)Si/SiO2 by Electron Spin Resonance: 29Si Hyperfine Structure and Electrical Relevance

Stesmans, A. L.

期刊名称MRS Proceedings
作者Stesmans, A. L.
卷第592卷
电子ISSN1946-4274
文件大小1571.76KB
发表时间1999-1
DOI10.1557/proc-592-21

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