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SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Machine Vision Applications in Industrial Inspection VII - <title>Image retrieval in the industrial environment</title>

SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Machine Vision Applications in Industrial Inspection VII - Image retrieval in the industrial environment

Tobin, Jr., Kenneth W.; Karnowski, Thomas P.; Ferrell, Regina K.; Tobin, Jr., Kenneth W.; Chang, Ning S.
  • 作者Tobin, Jr., Kenneth W.; Karnowski, Thomas P.; Ferrell, Regina K.; Tobin, Jr., Kenneth W.; Chang, Ning S.
  • 卷第3652卷
  • 印刷ISSN0277-786X
  • 文件大小4031.23KB
  • 发表时间1999
  • DOI10.1117/12.341138
  • 页码184-192
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