SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Optical Measurement Systems for Industrial Inspection - Digital refinement of interferograms obtained by double-pulse interferometry and automatic sign correction of phase gradients after FFT evaluation
Steinchen, Wolfgang; Maeckel, Peter; Nickel, J.; Voessing, Frank; Kupfer, Gerhard; Kujawinska, Malgorzata; Osten, Wolfgang
- 作者Steinchen, Wolfgang; Maeckel, Peter; Nickel, J.; Voessing, Frank; Kupfer, Gerhard; Kujawinska, Malgorzata; Osten, Wolfgang
- 卷第3824卷
- 印刷ISSN0277-786X
- 文件大小5850.20KB
- 发表时间1999
- DOI10.1117/12.364246
- 页码124-134