Layout Dependent Matching Analysis of CMOS Circuits
- 作者Kenichi OKADA; Hidetoshi ONODERA; Keikichi TAMARU
- 卷第25卷
- 期第3期
- 印刷ISSN0925-1030
- 电子ISSN1573-1979
- 文件大小141.02KB
- 发表时间2000-12
- DOI10.1023/a:1008386116423
- 页码309-318
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Calibration of the effective analyzing power for a 3He polarimeter at 443 MeVJ. Kamiya; K. Hatanaka; T. Adachi; K. Fujita; K. Hara; T. Kawabata; T. Noro; H. Sakaguchi; N. Sakamoto; Y. Sakemi; Y. Shimbara; Y. Shimizu; S. Terashima; M. Uchida; T. Wakasa; Y. Yasuda; H.P. Yoshida; M. Yosoi · 2003
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