Reliability, factor structure and validity of the Dutch Eysenck Personality Profiler
- 作者Peter Muris; Henk Schmidt; Harald Merckelbach; Eric Rassin
- 卷第29卷
- 期第5期
- 印刷ISSN0191-8869
- 文件大小118.83KB
- 发表时间2000
- DOI10.1016/s0191-8869(99)00237-8
- 页码857-868
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