海量图书期刊资源,随时随地畅享阅读乐趣
Modern techniques for surface and thin film analysisV. Rupertus · 2006
Teilchenstrahlinduzierte Prozesse an dielektrischen OberflächenV. Rupertus; U. Rothhaar; P. Köpfer; A. Lorenz; H. Oechsner · 1993
Interface characterization of PICVD-coated polymer substratesV. Rupertus; K. Berresheim; C. Ottermann; S. Thiel; M. Kopnarski; K. Bange · 1997
A Quick Test To Monitor the Delamination Propensity of Glass ContainersRupertus, V.; Hladik, B.; Rothhaar, U.; Scheumann, V. · PDA Journal of Pharmaceutical Science and Technology · 2014
Analysis of sputter deposited and evaporated tantalum oxide layers on SiO2by SNMS, XPS, TDS and TRFAK. -H. Müller; V. Rupertus; H. Oechsner; V. Scheuer; T. Tschudi · 1989
XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfacesU. Rothhaar; V. Rupertus; H. Oechsner · 1993
Characterization of ion-beam- and magnetron- sputtered YBa2Cu3O7−x high Tc superconducting films by secondary neutral mass spectrometry depth profilingC. Mössner; K.-D. Ufert; P. Köpfer; V. Rupertus; H. Oechsner · 1989