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[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Comparison of isothermal, constant current and SWEAT wafer level EM testing methods

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Comparison of isothermal, constant current and SWEAT wafer level EM testing methods

Lee, T.C.; Tibel, D.; Sullivan, T.D.
  • 作者Lee, T.C.; Tibel, D.; Sullivan, T.D.
  • 文件大小685.88KB
  • 发表时间2000
  • DOI10.1109/IRWS.2000.911902
  • 页码61-69
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