[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Comparison of isothermal, constant current and SWEAT wafer level EM testing methods
Lee, T.C.; Tibel, D.; Sullivan, T.D.
- 作者Lee, T.C.; Tibel, D.; Sullivan, T.D.
- 文件大小685.88KB
- 发表时间2000
- DOI10.1109/IRWS.2000.911902
- 页码61-69