Microprocessor Test and verification
- 期刊名称IEEE Design and Test of Computers
- 作者Abadir, M.; Dasgupta, S.
- 卷第17卷
- 期第4期
- 印刷ISSN0740-7475
- 文件大小35.59KB
- 发表时间2000-10
- DOI10.1109/mdt.2000.895001
- 页码4-5
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