[IEEE 56th ARFTG Conference Digest - Boulder, AZ, USA (2000.11.30-2000.12.1)] 56th ARFTG Conference Digest - High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers
- 作者Arz, Uwe; Williams, Dylan F.; Walker, David K.; Grabinski, Hartmut
- 文件大小87.11KB
- 发表时间2000
- DOI10.1109/arftg.2000.327425
- 页码1-6
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