[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Microwave performance of AlGaN/GaN metal insulator semiconductor field effect transistors
Chumbes, E.M.; Smart, J.A.; Prunty, T.; Shealy, J.R.
- 作者Chumbes, E.M.; Smart, J.A.; Prunty, T.; Shealy, J.R.
- 文件大小411.34KB
- 发表时间2000
- DOI10.1109/iedm.2000.904337
- 页码385-388