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Correlation between the gate bias dependence of the probability of anode hole injection and breakdown in thin silicon dioxide films

Correlation between the gate bias dependence of the probability of anode hole injection and breakdown in thin silicon dioxide films

Samanta, Piyas; Sarkar, C. K.

期刊名称Applied Physics Letters
作者Samanta, Piyas; Sarkar, C. K.
卷第77卷
期第26期
印刷ISSN0003-6951
文件大小306.54KB
发表时间2000
DOI10.1063/1.1332838

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