Measurements of nanometer scale interface diffusion between tungsten and niobium thin films using high frequency laser based ultrasound
- 期刊名称The Journal of the Acoustical Society of America
- 作者Richardson, C. J. K.; Ehrlich, M. J.; Wagner, J. W.
- 卷第107卷
- 期第4期
- 印刷ISSN0001-4966
- 文件大小165.39KB
- 发表时间2000
- DOI10.1121/1.428482
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