[IEEE Comput. Soc 15th International Conference on Pattern Recognition - Barcelona, Spain (3-7 Sept. 2000)] Proceedings 15th International Conference on Pattern Recognition. ICPR-2000 - Comparison of face verification results on the XM2VTFS database
Matas, J.; Hamouz, M.; Jonsson, K.; Kittler, J.; Li, Y.; Kotropoulos, C.; Tefas, A.; Pitas, I.; Teewoon Tan, ; Hong Yan, ; Smeraldi, F.; Bigun, J.; Capdevielle, N.; Gerstner, W.; Ben-Yacoub, S.; Abeljaoued, Y.; Mayoraz, E.
- 作者Matas, J.; Hamouz, M.; Jonsson, K.; Kittler, J.; Li, Y.; Kotropoulos, C.; Tefas, A.; Pitas, I.; Teewoon Tan, ; Hong Yan, ; Smeraldi, F.; Bigun, J.; Capdevielle, N.; Gerstner, W.; Ben-Yacoub, S.; Abeljaoued, Y.; Mayoraz, E.
- 卷第4卷
- 文件大小483.43KB
- 发表时间2000
- DOI10.1109/icpr.2000.903052
- 页码858-863