In-SituEllipsometric Observations of Thickness Change in the Layers of Ag/a-As2S3Film System with Progression of Photodoping
- 作者Y. Murakami; T. Ogawa; M. Wakaki; S. Kawabata
- 文件大小50.64KB
- 发表时间2000
- DOI10.1143/JJAP.39.509
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