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Growth Behaviour of Engineered Porous Thin Films – Measurement and Modeling

Growth Behaviour of Engineered Porous Thin Films – Measurement and Modeling

Vick, D.; Smy, T.; Dick, B.; Kennedy, S.; Brett, M. J.

期刊名称MRS Proceedings
作者Vick, D.; Smy, T.; Dick, B.; Kennedy, S.; Brett, M. J.
卷第648卷
电子ISSN1946-4274
文件大小4204.26KB
发表时间2000-1
DOI10.1557/proc-648-p3.43

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