SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1999 - Boulder, CO (Monday 4 October 1999)] Laser-Induced Damage in Optical Materials: 1999 - Error analysis of ISO 11551
- 作者Arenberg, Jonathan W.; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J.
- 卷第3902卷
- 印刷ISSN0277-786X
- 文件大小175.41KB
- 发表时间2000
- DOI10.1117/12.379344
- 页码324-331
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