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SPIE Proceedings [SPIE International Topical Symposium on Advanced Optical Manufacturing and Testing Technology - Chengdu, China (Wednesday 1 November 2000)] Advanced Optical Manufacturing and Testing Technology 2000 - <title>Technology of sagittal-focusing crystal manufacturing and testing the monochromator in synchrotron radiation</title>

SPIE Proceedings [SPIE International Topical Symposium on Advanced Optical Manufacturing and Testing Technology - Chengdu, China (Wednesday 1 November 2000)] Advanced Optical Manufacturing and Testing Technology 2000 - Technology of sagittal-focusing crystal manufacturing and testing the monochromator in synchrotron radiation

Zhou, Renkui; Fu, Xuan; Zhou, Sizhong; Xia, Shaojian; Yang, Li; Pollicove, Harvey M.; Xin, Qiming; Wyant, James C.
  • 作者Zhou, Renkui; Fu, Xuan; Zhou, Sizhong; Xia, Shaojian; Yang, Li; Pollicove, Harvey M.; Xin, Qiming; Wyant, James C.
  • 卷第4231卷
  • 印刷ISSN0277-786X
  • 文件大小170.38KB
  • 发表时间2000
  • DOI10.1117/12.402801
  • 页码515-519
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