SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Content-based image retrieval for semiconductor manufacturing
Karnowski, Thomas P.; Tobin, Jr., Kenneth W.; Ferrell, Regina K.; Lakhani, Fred; Tobin, Jr., Kenneth W.
- 作者Karnowski, Thomas P.; Tobin, Jr., Kenneth W.; Ferrell, Regina K.; Lakhani, Fred; Tobin, Jr., Kenneth W.
- 卷第3966卷
- 印刷ISSN0277-786X
- 文件大小1158.41KB
- 发表时间2000
- DOI10.1117/12.380070
- 页码162-172