SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors
Krueger, Sven; Wernicke, Guenther K.; Osten, Wolfgang; Kayser, Daniel; Demoli, Nazif; Gruber, Hartmut; Tobin, Jr., Kenneth W.
- 作者Krueger, Sven; Wernicke, Guenther K.; Osten, Wolfgang; Kayser, Daniel; Demoli, Nazif; Gruber, Hartmut; Tobin, Jr., Kenneth W.
- 卷第3966卷
- 印刷ISSN0277-786X
- 文件大小2227.54KB
- 发表时间2000
- DOI10.1117/12.380068
- 页码145-153