SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Intelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision - Automatic alignment of electron tomography images using markers
- 作者Brandt, Sami S.; Heikkonen, Jukka; Casasent, David P.
- 卷第4197卷
- 印刷ISSN0277-786X
- 文件大小441.51KB
- 发表时间2000
- DOI10.1117/12.403773
- 页码277-287
SPIE Proceedings [SPIE Intelligent Systems & Advanced Manufacturing - Pittsburgh, PA (Tuesday 14 October 1997)] Microrobotics and Microsystem Fabrication - <title>Design and highly accurate 3D displacement characterization of monolithic SMA microgripper using computer vision</title>Bellouard, Yves; Sulzmann, Armin; Jacot, Jacques; Clavel, Reymond; Sulzmann, Armin · 1998
SPIE Proceedings [SPIE 1993 North American Conference on Smart Structures and Materials - Albuquerque, NM (Monday 1 February 1993)] Smart Structures and Materials 1993: Smart Structures and Intelligent Systems - <title>Comparison of classical control with robust control for SMA smart structures</title>Rhee, Seung-Woo; Koval, Leslie R.; Hagood, Nesbitt W.; Knowles, Gareth J. · 1993