SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Laser Interferometry X: Techniques and Analysis - Surface strain characterization using time-division-multiplexed 3D shearography
- 作者James, Stephen W.; Groves, Roger M.; Tatam, Ralph P.; Kujawinska, Malgorzata; Pryputniewicz, Ryszard J.; Takeda, Mitsuo
- 卷第4101卷
- 印刷ISSN0277-786X
- 文件大小2229.33KB
- 发表时间2000
- DOI10.1117/12.498404
- 页码384-393
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