Analysis of Damage and Stress Fields of a Mode I Creep Crack in Steady-State Growth.
LIU, Yan; HIRANO, Toshiyuki; MURAKAMI, Sumio
- 期刊名称Transactions of the Japan Society of Mechanical Engineers Series A
- 作者LIU, Yan; HIRANO, Toshiyuki; MURAKAMI, Sumio
- 卷第66卷
- 期第643期
- 印刷ISSN0387-5008
- 电子ISSN1884-8338
- 文件大小839.38KB
- 发表时间2000
- DOI10.1299/kikaia.66.604
- 页码604-611