Machine vision system for curved surface inspection
Min-Fan Ricky Lee; Clarence W. de Silva; Elizabeth A. Croft; Q.M. Jonathan Wu
- 作者Min-Fan Ricky Lee; Clarence W. de Silva; Elizabeth A. Croft; Q.M. Jonathan Wu
- 卷第12卷
- 期第4期
- 印刷ISSN0932-8092
- 电子ISSN1432-1769
- 文件大小1325.85KB
- 发表时间2000-12
- DOI10.1007/s001380000043
- 页码177-188