Advances in Surface-Light-Scattering Instrumentation and Analysis: Noninvasive Measuring of Surface Tension, Viscosity, and Other Interfacial Parameters
Meyer, William V.; Wegdam, Gerard H.; Fenistein, Denis; Mann, Jr., J. Adin
- 期刊名称ao/40/24/ao-40-24-4113.pdf
- 作者Meyer, William V.; Wegdam, Gerard H.; Fenistein, Denis; Mann, Jr., J. Adin
- 卷第40卷
- 期第24期
- 印刷ISSN0003-6935
- 电子ISSN1539-4522
- 文件大小1782.48KB
- 发表时间2001
- DOI10.1364/AO.40.004113