Understanding refraction and accommodation through ‘retinal imaging’ aberrometry: A case report
Ronald R Krueger; Michael Mrochen; Maik Kaemmerer; Theo Seiler
- 作者Ronald R Krueger; Michael Mrochen; Maik Kaemmerer; Theo Seiler
- 卷第108卷
- 期第4期
- 印刷ISSN0161-6420
- 文件大小1184.42KB
- 发表时间2001
- DOI10.1016/s0161-6420(00)00601-1