A Critical Evaluation of the Resolution Properties of B-Spline and Compact Finite Difference Methods
Wai Yip Kwok; Robert D. Moser; Javier Jiménez
- 作者Wai Yip Kwok; Robert D. Moser; Javier Jiménez
- 卷第174卷
- 期第2期
- 印刷ISSN0021-9991
- 电子ISSN1090-2716
- 文件大小266.45KB
- 发表时间2001
- DOI10.1006/jcph.2001.6919
- 页码510-551