Numerical Determination of Shallow Electronic States Bound by Dislocations in Semiconductors
- 作者J.-L. Farvacque; P. François
- 卷第223卷
- 期第3期
- 印刷ISSN0370-1972
- 电子ISSN1521-3951
- 文件大小174.46KB
- 发表时间2001
- DOI10.1002/1521-3951(200102)223:3<635::aid-pssb635>3.0.co;2-k
- 页码635-648
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