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[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Comparative thermal characterizations of GaAs and SiC devices

[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Comparative thermal characterizations of GaAs and SiC devices

Mittereder, J.A.; Anderson, W.T.; Buot, F.A.; Ioannou, D.E.

作者Mittereder, J.A.; Anderson, W.T.; Buot, F.A.; Ioannou, D.E.
文件大小535.88KB
发表时间2001
DOI10.1109/GAASRW.2001.995723
页码3-11

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