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[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits

[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - Physical and predictive models of ultra thin oxide reliability in CMOS devices and circuits

Stathis, J.H.

作者Stathis, J.H.
文件大小2082.90KB
发表时间2001
DOI10.1109/relphy.2001.922893
页码132-149

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