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[IEEE ICSD'01. Proceedings of the 2001 IEEE 7th International Conference on Solid Dielectrics - Eindhoven, Netherlands (25-29 June 2001)] ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) - PD inception conditions and PD pattern of defects in PILC

[IEEE ICSD'01. Proceedings of the 2001 IEEE 7th International Conference on Solid Dielectrics - Eindhoven, Netherlands (25-29 June 2001)] ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) - PD inception conditions and PD pattern of defects in PILC

Muramoto, Y.; Gulski, E.; Wester, F.J.; Smit, J.J.

作者Muramoto, Y.; Gulski, E.; Wester, F.J.; Smit, J.J.
文件大小426.38KB
发表时间2001
DOI10.1109/icsd.2001.955659
页码369-372

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