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A stochastic model for the interconnection topology of digital circuits

A stochastic model for the interconnection topology of digital circuits

Verplaetse, P.; Stroobandt, D.; Van Campenhout, J.
  • 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • 作者Verplaetse, P.; Stroobandt, D.; Van Campenhout, J.
  • 卷第9卷
  • 期第6期
  • 印刷ISSN1063-8210
  • 电子ISSN1557-9999
  • 文件大小90.64KB
  • 发表时间2001-12
  • DOI10.1109/92.974907
  • 页码938-942
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