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[IEEE 2001 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (30 June 2001)] Proceedings 2001 IEEE Hong Kong Electron Devices Meeting (Cat. No.01TH8553) - Dielectric traps in amorphous silicon oxynitride

[IEEE 2001 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (30 June 2001)] Proceedings 2001 IEEE Hong Kong Electron Devices Meeting (Cat. No.01TH8553) - Dielectric traps in amorphous silicon oxynitride

Hei Wong, ; Gritsenko, V.A.

作者Hei Wong, ; Gritsenko, V.A.
文件大小719.97KB
发表时间2001
DOI10.1109/hkedm.2001.946934
页码132-139

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