[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Exploring physical mechanisms for sudden beta degradation in GaAs-based HBTs
- 作者Welser, R.E.; DeLuca, P.M.
- 文件大小1050.04KB
- 发表时间2001
- DOI10.1109/gaasrw.2001.995741
- 页码135-157
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