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Uniaxial dielectric anisotropy in Ba[sub 0.5]Sr[sub 0.5]TiO[sub 3] films studied by evanescent-probe microscopy

Uniaxial dielectric anisotropy in Ba[sub 0.5]Sr[sub 0.5]TiO[sub 3] films studied by evanescent-probe microscopy

Wang, Y. G.; Reeves, M. E.; Kim, W. J.; Horwitz, J. S.; Rachford, F. J.

期刊名称Applied Physics Letters
作者Wang, Y. G.; Reeves, M. E.; Kim, W. J.; Horwitz, J. S.; Rachford, F. J.
卷第78卷
期第24期
印刷ISSN0003-6951
文件大小314.07KB
发表时间2001
DOI10.1063/1.1377628

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