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[IEEE 14th International Vacuum Microelectronics Conference - Davis, CA, USA (12-16 Aug. 2001)] IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) - Negative- and positive-temperature dependences of electron emission properties of hydrogen- and oxygen-terminated diamond field emitters

[IEEE 14th International Vacuum Microelectronics Conference - Davis, CA, USA (12-16 Aug. 2001)] IVMC 2001. Proceedings of the 14th International Vacuum Microelectronics Conference (Cat. No.01TH8586) - Negative- and positive-temperature dependences of electron emission properties of hydrogen- and oxygen-terminated diamond field emitters

Gotoh, Y.; Nakahara, H.; Kondo, T.; Tsuji, H.; Ishikawa, J.
  • 作者Gotoh, Y.; Nakahara, H.; Kondo, T.; Tsuji, H.; Ishikawa, J.
  • 文件大小128.60KB
  • 发表时间2001
  • DOI10.1109/ivmc.2001.939771
  • 页码297-298
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