发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - An application-specific usage model for flash memory read disturb reliability

[IEEE 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual - Orlando, FL, USA (30 April-3 May 2001)] 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) - An application-specific usage model for flash memory read disturb reliability

Harp, T.S.; Kuhn, P.J.; Higman, J.M.; Paulsen, R.E.; Hornung, B.E.
  • 作者Harp, T.S.; Kuhn, P.J.; Higman, J.M.; Paulsen, R.E.; Hornung, B.E.
  • 文件大小310.52KB
  • 发表时间2001
  • DOI10.1109/relphy.2001.922914
  • 页码280-282
同标题推荐
同期刊推荐
← 返回【学霸图书馆】主页
© 2026 学霸图书馆 · 让阅读成为习惯