RF CMOS RELIABILITY
- 期刊名称International Journal of High Speed Electronics and Systems
- 作者NASEH, SASAN; DEEN, M. JAMAL
- 卷第11卷
- 期第4期
- 印刷ISSN0129-1564
- 电子ISSN1793-6438
- 文件大小3844.20KB
- 发表时间2001-12
- DOI10.1142/S0129156401001088
- 页码1249-1295
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