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Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Wernicke, Gu¨nther
  • 期刊名称Journal of Electronic Imaging
  • 作者Wernicke, Gu¨nther
  • 卷第10卷
  • 期第1期
  • 印刷ISSN1017-9909
  • 文件大小540.84KB
  • 发表时间2001-01-01
  • DOI10.1117/1.1318908
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