Characterization of etched facets for GaN-based lasers

• 作者M. Scherer; V. Schwegler; M. Seyboth; F. Eberhard; C. Kirchner; M. Kamp; G. Ulu; M.S. Ünlü; R. Gruhler; O. Hollricher
• 卷第230卷
• 印刷ISSN0022-0248
• 文件大小173.51KB
• 发表时间2001
• DOI10.1016/s0022-0248(01)01296-9
• 页码554-557