[IEEE 2001 IEEE MTT-S International Microwave Symposium Digest - Phoenix, AZ, USA (20-25 May 2001)] 2001 IEEE MTT-S International Microwave Sympsoium Digest (Cat. No.01CH37157) - Intrinsic noise currents in deep submicron MOSFETs
Chih-Hung Chen, ; Deen, M.J.; Yuhua Cheng, ; Matloubian, M.
- 作者Chih-Hung Chen, ; Deen, M.J.; Yuhua Cheng, ; Matloubian, M.
- 卷第2卷
- 文件大小276.80KB
- 发表时间2001
- DOI10.1109/mwsym.2001.967022
- 页码835-839