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[IEEE 2001 ICRA. IEEE International Conference on Robotics and Automation - Seoul, South Korea (21-26 May 2001)] Proceedings 2001 ICRA. IEEE International Conference on Robotics and Automation (Cat. No.01CH37164) - Identification of contact conditions from contaminated data of contact force and moment

[IEEE 2001 ICRA. IEEE International Conference on Robotics and Automation - Seoul, South Korea (21-26 May 2001)] Proceedings 2001 ICRA. IEEE International Conference on Robotics and Automation (Cat. No.01CH37164) - Identification of contact conditions from contaminated data of contact force and moment

Mouri, T.; Yamada, T.; Iwai, A.; Mimura, N.; Funahashi, Y.

作者Mouri, T.; Yamada, T.; Iwai, A.; Mimura, N.; Funahashi, Y.
卷第1卷
文件大小688.67KB
发表时间2001
DOI10.1109/robot.2001.932615
页码597-603

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