Thermal stability of grain structure and defects in submicrocrystalline and nanocrystalline nickel
- 作者R Klemm; E Thiele; C Holste; J Eckert; N Schell
- 卷第46卷
- 期第9期
- 印刷ISSN1359-6462
- 文件大小146.49KB
- 发表时间2002
- DOI10.1016/s1359-6462(02)00054-4
- 页码685-690
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