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SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Optical Security and Counterfeit Deterrence Techniques IV - <title>Geometrical features of transformed phase masks in the optical/digital device for identification of credit cards</title>

SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Optical Security and Counterfeit Deterrence Techniques IV - Geometrical features of transformed phase masks in the optical/digital device for identification of credit cards

Muravsky, Leonid I.; Kulynych, Yaroslav P.; Maksymenko, Olexander P.; Voronyak, Taras I.; Kostyukevych, Sergey A.; van Renesse, Rudolf L.
  • 作者Muravsky, Leonid I.; Kulynych, Yaroslav P.; Maksymenko, Olexander P.; Voronyak, Taras I.; Kostyukevych, Sergey A.; van Renesse, Rudolf L.
  • 卷第4677卷
  • 印刷ISSN0277-786X
  • 文件大小184.64KB
  • 发表时间2002
  • DOI10.1117/12.462734
  • 页码392-399
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