SPIE Proceedings [SPIE Electronic Imaging 2002 - San Jose, CA (Saturday 19 January 2002)] Optical Security and Counterfeit Deterrence Techniques IV - Geometrical features of transformed phase masks in the optical/digital device for identification of credit cards
Muravsky, Leonid I.; Kulynych, Yaroslav P.; Maksymenko, Olexander P.; Voronyak, Taras I.; Kostyukevych, Sergey A.; van Renesse, Rudolf L.
- 作者Muravsky, Leonid I.; Kulynych, Yaroslav P.; Maksymenko, Olexander P.; Voronyak, Taras I.; Kostyukevych, Sergey A.; van Renesse, Rudolf L.
- 卷第4677卷
- 印刷ISSN0277-786X
- 文件大小184.64KB
- 发表时间2002
- DOI10.1117/12.462734
- 页码392-399